TīmeklisFEI Scios™ 是一款超高分辨率 DualBeam™ 分析系统,能为包括磁性材料在内的众多样本提供出色的二维和三维性能。 FEI Scios 的创新功能可提高通量、精度与易用性,非常适于学院、政府和工业研究环境中的纳米量级研究与分析。 高级检测技术是 FEI Scios 的核心技术。 透镜内 FEI Trinity™ 检测技术能够同时收集所有信号,既节省了时间还 … TīmeklisFEI Helios G4 Dual Beam Helios G4 UC is part of the fourth generation of the leading Helios Dual Beam family. It combines the innovative Elstar electron column with high-current UC+ technology for extreme high-resolution imaging and the highest materials contrast with the superior Tomahawk ion column for the fastest, easiest, and most …
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TīmeklisMicroscope: FEI Helios SEM/FIB Microscope: FEI Quanta 400 ESEM FEG Microscope: FEI Tecnai F20 Transmission Electron Microscope (TEM) with Cryo Microscope: FEI Titan Themis3 Microscope: JEOL 2100 Field Emission Gun Transmission Electron Microscope Microscope: JEOL 6500F Scanning Electron Microscope TīmeklisFEI Helios NanoLab 400S. (TSS#6238) This 2015 Helios NanoLab 400ST DualBeam with STEM is used for TEM lamella prep, circuit edit front & back, defect/failure … sunscreen mist trail
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http://lmf.iphy.ac.cn/instruments_detail.php?id=21042 Tīmeklis中国科学院物理研究所微加工实验室 聚焦离子束系统 Helios 型号: Helios 600i 厂家: 美国FEI公司 性能指标: Ga离子束系统: 交叉点分辨率:≤ 4.5 nm @ 30 kV 加速电压: 500 V-30 kV 离子束流:1 pA 至65 nA 束流密度:最大值可达60 A/cm 2 辅助气体注入系统: 沉积材料:离子束/电子束诱导的Pt、W 沉积 增强刻蚀:Si, SiO 2 等 样品尺 … TīmeklisThe Helios NanoLab 400 includes a five-axis stage with 100 mm of travel in X and Y. All-axis piezo drive and chamber mounting provide industry-leading stage … As part of the EAG Laboratory network, Eurofins Nanolab Technologies offers … Send your quotation and newslettter subscription requests, wall chart … Nanolab Technologies offers cutting edge technology and expertise for Failure … sunscreen mist spray machine